Zhang, JF, Duan, M, Ji, Z and Zhang, WD (2015) NBTI prediction and its induced time dependent variation. In: Proceedings of 2015 11th IEEE International Conference on ASIC (ASICON) . pp. 1-4. (2015 11th IEEE International Conference on ASIC (ASICON), 03 November 2015 - 06 November 2015, Chengdu, China).

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Abstract

Negative bias temperature instability (NBTI) prediction relies on a reliable extraction of power exponents from its kinetics. When measured by fast pulse technique, however, the kinetics does not follow a power law. This paper reviews the recent progresses on how to restore the power law, based on the As-grown-Generation (AG) model. For nanometer sized devices, NBTI is different for different devices, inducing a time-dependent variation. The new technique proposed for characterizing this Time-dependent Variation accounting for within-a-device-Fluctuation (TVF) will be reviewed.

Item Type:	Conference or Workshop Item (Paper)
Subjects:	T Technology > TA Engineering (General). Civil engineering (General)
Divisions:	Electronics & Electrical Engineering (merged with Engineering 10 Aug 20)
Publisher:	IEEE
Date Deposited:	19 Nov 2015 08:49
Last Modified:	13 Apr 2022 15:14
URI:	https://researchonline.ljmu.ac.uk/id/eprint/2354

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