Zhang, JF and Duan, M and Ji, Z and Zhang, WD (2015) NBTI prediction and its induced time dependent variation. In: Proceedings of 2015 11th IEEE International Conference on ASIC (ASICON) . pp. 1-4. (2015 11th IEEE International Conference on ASIC (ASICON), 03 November 2015 - 06 November 2015, Chengdu, China).
Zhang-JF-invited-ASICON2015-v3.pdf - Accepted Version
Negative bias temperature instability (NBTI) prediction relies on a reliable extraction of power exponents from its kinetics. When measured by fast pulse technique, however, the kinetics does not follow a power law. This paper reviews the recent progresses on how to restore the power law, based on the As-grown-Generation (AG) model. For nanometer sized devices, NBTI is different for different devices, inducing a time-dependent variation. The new technique proposed for characterizing this Time-dependent Variation accounting for within-a-device-Fluctuation (TVF) will be reviewed.
|Item Type:||Conference or Workshop Item (Paper)|
|Subjects:||T Technology > TA Engineering (General). Civil engineering (General)|
|Divisions:||Electronics and Electrical Engineering|
|Date Deposited:||19 Nov 2015 08:49|
|Last Modified:||08 Aug 2016 11:27|
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