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True Random Number Generator Based on Switching Probability of Volatile Gexse1-X Ovonic Threshold Switching Selectors

Chai, Z, Freitas, P, Zhang, WD, Zhang, JF and Marsland, J (2021) True Random Number Generator Based on Switching Probability of Volatile Gexse1-X Ovonic Threshold Switching Selectors. In: IEEE Explore . (2021 IEEE 14th International Conference on ASIC, 26 October 2021 - 29 October 2021, Kunming, China).

ASICON-2021-WZhang.pdf - Accepted Version

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GexSe1-x Ovonic Threshold Switching (OTS) selector is a promising candidate to suppress the sneak current paths in resistive switching memory arrays. A novel method is developed to quantitatively characterize the variations in the threshold voltage (Vth), the hold voltage (Vhd), and the switching probability dependence on the OTS operation conditions. The time-to-switch-on/off (ton/toff) at a constant VOTS follows the Weibull distribution, based on which the dependence of switching probability on pulse waveform, bias, and time can be extracted and extrapolated. Based on this analysis, a novel technique for true random number generator (TRNG) application is proposed. The inherent variability in OTS threshold voltage results in a bimodal distribution of on/off states which can be easily converted into digital bits. The experimental evaluation shows that the proposed TRNG enables the generation of high-quality random bits that passed 12 tests in the NIST statistical test suite without complex external circuits for post-processing.

Item Type: Conference or Workshop Item (Paper)
Additional Information: © 2021 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
T Technology > TK Electrical engineering. Electronics. Nuclear engineering
Divisions: Engineering
Publisher: IEEE
Date Deposited: 30 Sep 2021 09:26
Last Modified: 13 Apr 2022 15:18
URI: https://researchonline.ljmu.ac.uk/id/eprint/15574
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