Items where Author is "Cai, Y"

Article

Zhai, Q, Zhang, J, Wang, X, Pastorello, A, Filippenko, AV, Vinkó, J, Brink, TG, Han, Y, Valerin, G, Rosa, NE, Cai, Y, Lin, W, Yang, Y, Zheng, WK, Meng, X, Wu, C, Li, L, Zhao, Z, Wheeler, JC, Prieto, JL et al (2026) SN 2022erq: A Superluminous Thermonuclear Supernova with Escalating Preexplosion Mass Loss. The Astrophysical Journal, 1007 (2). ISSN 0004-637X

Ferrari, L, Folatelli, G, Kuncarayakti, H, Stritzinger, M, Maeda, K, Bersten, M, Román Aguilar, LM, Sáez, MM, Dessart, L, Lundqvist, P, Mazzali, P ORCID: 0000-0001-6876-8284, Nagao, T, Ashall, C, Bose, S, Brennan, SJ, Cai, Y, Handberg, R, Holmbo, S, Karamehmetoglu, E, Pastorello, A et al (2023) The metamorphosis of the Type Ib SN 2019yvr: late-time interaction. Monthly Notices of the Royal Astronomical Society: Letters, 529 (1). L33-L40. ISSN 1745-3925

Fiore, A ORCID: 0000-0002-0403-3331, Benetti, S ORCID: 0000-0002-3256-0016, Tartaglia, L, Jerkstrand, A, Salmaso, I, Tomasella, L ORCID: 0000-0002-3697-2616, Morales-Garoffolo, A, Geier, S, Elias-Rosa, N, Cappellaro, E, Wang, X, Mo, J, Chen, Z, Yan, S, Pastorello, A, Mazzali, PA, Ciolfi, R ORCID: 0000-0003-3140-8933, Cai, Y ORCID: 0000-0002-7714-493X, Fraser, M ORCID: 0000-0003-2191-1674, Gutierrez, CP ORCID: 0000-0003-2375-2064 et al (2023) Detailed spectrophotometric analysis of the superluminous and fast evolving SN 2019neq. Monthly Notices of the Royal Astronomical Society, 527 (3). pp. 6473-6494. ISSN 0035-8711

Du, Y, Jing, L, Fang, H, Chen, H, Cai, Y, Wang, R, Zhang, JF and Ji, Z (2020) Exploring the impact of random telegraph noise-induced accuracy loss in Resistive RAM-based deep neural network. IEEE Transactions on Electron Devices, 67 (8). pp. 3335-3340. ISSN 0018-9383

Conference or Workshop Item

Kang, J, Yu, Z, Wu, L, Fang, Y, Wang, Z, Cai, Y, Ji, Z, Zhang, JF, Wang, R, Yang, Y and Huang, R (2017) Time-Dependent Variability in RRAM-based Analog Neuromorphic System for Pattern Recognition. In: Technical Digest of the IEEE International Electron Devices Meeting (IEDM), . (2017 International Electron Devices Meeting (IEDM),, 2nd-6th December 2017, San Fransisco, USA).