Items where Author is "Horiguchi,, N"
![]() | Up a level |
Group by: Item Type | No Grouping
Jump to: Article
Number of items: 1.
Article
Manut, AB, Zhang, JF, Duan, M, Ji, Z, Zhang, WD, kaczer, B, Schram, T, Horiguchi,, N and Groeseneken, G (2015) Impact of Hot Carrier Aging on Random Telegraph Noise and Within a Device Fluctuation. IEEE Journal of the Electron Devices Society. ISSN 2168-6734