Items where Author is "Kang, J"

Article

Kong, X, Huang, R, Li, H ORCID: 0000-0001-6429-9097, Kang, J ORCID: 0000-0002-8975-5025, Dong, Y ORCID: 0000-0002-7242-5388, Guedes Soares, C ORCID: 0000-0002-8570-4263 and Wang, J ORCID: 0000-0003-4646-9106 (2026) Predictive risk analysis for leakage accidents with dynamic behaviour. Reliability Engineering and System Safety, 271. ISSN 0951-8320 (Accepted)

Dornelas, M, Antão, LH, Bates, AE, Brambilla, V, Chase, JM, Chow, CFY, Fontrodona‐Eslava, A, Magurran, AE, Martins, IS, Moyes, F, Sagouis, A, Adu‐Acheampong, S, Acquah‐Lamptey, D, Adam, D, Ajani, PA, Albaina, A, Almaraz, P, An, J, Anderson, RS, Anderson, MJR et al (2025) BioTIME 2.0: Expanding and Improving a Database of Biodiversity Time Series. Global Ecology and Biogeography, 34 (5). ISSN 1466-822X

Lanza, M, Wong, HSP, Pop, E, Ielmini, D, Strukov, D, Regan, BC, Larcher, L, Villena, MA, Yang, JJ, Goux, L, Belmonte, A, Yang, Y, Puglisi, FM, Kang, J, Magyari-Köpe, B, Yalon, E, Kenyon, A, Buckwell, M, Mehonic, A, Shluger, A et al (2018) Recommended Methods to Study Resistive Switching Devices. Advanced Electronic Materials. ISSN 2199-160X

Conference or Workshop Item

Kang, J, Yu, Z, Wu, L, Fang, Y, Wang, Z, Cai, Y, Ji, Z, Zhang, JF, Wang, R, Yang, Y and Huang, R (2017) Time-Dependent Variability in RRAM-based Analog Neuromorphic System for Pattern Recognition. In: Technical Digest of the IEEE International Electron Devices Meeting (IEDM), . (2017 International Electron Devices Meeting (IEDM),, 2nd-6th December 2017, San Fransisco, USA).