Items where Author is "Marsland, JS"

Article

Brown, J, Tok, KH, Gao, R, Ji, Z, Zhang, W, Marsland, JS, Chiarella, T, Franco, J, Kaczer, B, Linten, D and Zhang, JF ORCID: 0000-0003-4987-6428 (2023) A Pragmatic Model to Predict Future Device Aging. IEEE Access, 11. pp. 127725-127736. ISSN 2169-3536

Tok, KH, Zhang, JF ORCID: 0000-0003-4987-6428, Brown, J ORCID: 0000-0001-6027-9179, Ye, Z ORCID: 0000-0003-2368-0996, Ji, Z ORCID: 0000-0003-1138-804X, Zhang, WD ORCID: 0000-0003-4600-7382 and Marsland, JS (2022) AC RTN: Testing, Modeling, and Prediction. IEEE Transactions on Electron Devices. pp. 1-7. ISSN 0018-9383

Tok, KH, Mehedi, M, Zhang, JF ORCID: 0000-0003-4987-6428, Brown, J, Ye, Z, Ji, Z, Zhang, W, Marsland, JS, Asenov, A and Georgiev, V (2022) An Integral Methodology for Predicting Long Term RTN. IEEE Transactions on Electron Devices. ISSN 0018-9383

Mehedi, M, Tok, KH, Zhang, JF, Ji, Z, Ye, Z, Zhang, WD and Marsland, JS (2020) An assessment of the statistical distribution of Random Telegraph Noise Time Constants. IEEE Access, 8. pp. 182273-182282. ISSN 2169-3536