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Items where Author is "Ye, Z"

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Number of items: 9.

Article

Wang, R, Gerstein, HC, Van Spall, HGC, Lip, GYH, Olier, I, Ortega-Martorell, S, Thabane, L, Ye, Z and Li, G (2023) Relationship between remnant cholesterol and risk of heart failure in participants with diabetes mellitus. European heart journal. Quality of care & clinical outcomes, 9 (5). pp. 537-545. ISSN 2058-5225

Miao, W, Liu, Q, Zhang, Q, Xu, Z, Li, C, Yue, M, Zhang, W and Ye, Z (2022) Recommendation for strut designs of vertical axis wind turbines: Effects of strut profiles and connecting configurations on the aerodynamic performance. Energy Conversion and Management, 276. ISSN 0196-8904

Wang, R, Olier, I, Ortega-Martorell, S, Liu, Y, Ye, Z, Lip, GYH and Li, G (2022) Association between metabolically healthy obesity and risk of atrial fibrillation: taking physical activity into consideration. Cardiovascular Diabetology, 21 (1).

Tok, KH, Zhang, JF, Brown, J, Ye, Z, Ji, Z, Zhang, WD and Marsland, JS (2022) AC RTN: Testing, Modeling, and Prediction. IEEE Transactions on Electron Devices. pp. 1-7. ISSN 0018-9383

Tok, KH, Mehedi, M, Zhang, JF, Brown, J, Ye, Z, Ji, Z, Zhang, W, Marsland, JS, Asenov, A and Georgiev, V (2022) An Integral Methodology for Predicting Long Term RTN. IEEE Transactions on Electron Devices. ISSN 0018-9383

Mehedi, M, Tok, KH, Ye, Z, Zhang, JF, Ji, Z, Zhang, WD and Marsland, J (2021) On the accuracy in modelling the statistical distribution of Random Telegraph Noise Amplitude. IEEE Access. ISSN 2169-3536

Mehedi, M, Tok, KH, Zhang, JF, Ji, Z, Ye, Z, Zhang, WD and Marsland, JS (2020) An assessment of the statistical distribution of Random Telegraph Noise Time Constants. IEEE Access, 8. pp. 182273-182282. ISSN 2169-3536

Conference or Workshop Item

Mehedi, M, Tok, KH, Zhang, JF, Ji, Z, Ye, Z, Zhang, WD and Marsland, J (2021) An integrated method for extracting the statistical distribution of RTN time constants. In: 2021 IEEE 14th International Conference on ASIC (ASICON) . (IEEE 14th International Conference on ASIC (ASICON), 26 October 2021 - 29 October 2021, Kunming, China (Online)).

Zhang, JF, Duan, M, Mehedi, M, Tok, D, Ye, Z, Ji, Z and Zhang, WD Defect loss and its physical processes. In: IEEE 15th International Conference on Solid-State and Integrated-Circuit Technology, 03 November 2020 - 06 November 2020, Kunming. (Accepted)

This list was generated on Thu Mar 28 19:33:39 2024 UTC.