Facial reconstruction

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Items where Author is "Zhang, WEI"

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Article

Zhang, JF, Ji, Z and Zhang, WEI (2017) As-grown-Generation (AG) Model of NBTI: a shift from fitting test data to prediction. Microelectronics Reliability. ISSN 0026-2714

Conference or Workshop Item

Ji, Z, Zhang, JF, Zhang, WEI and Zhang, X (2014) A single device based Voltage Step Stress (VSS) Technique for fast reliability screening. In: Reliability Physics Symposium, 2014 IEEE International . GD.2.1-GD.2.4. (Reliability Physics Symposium, 2014, 1st - 5th June 2014, Waikoloa, HI).

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