Zhang, G and Deng, W and Murphy, MF and Lilley, F and Harvey, D and Burton, DR (2015) Analysis of Dynamic Cantilever Behaviour in Tapping Mode Atomic Force Microscopy. Microscopy Research and Technique. ISSN 1097-0029
Paper%20for%20MRT%20accepted%20version.pdf - Accepted Version
Restricted to Repository staff only until 25 August 2017.
Tapping mode Atomic Force Microscopy (AFM) provides phase images in addition to height and amplitude images. Although the behaviour of tapping mode AFM has been investigated using mathematical modelling, comprehensive understanding of the behaviour of tapping mode AFM still poses a significant challenge to the AFM community, involving issues such as the correct interpretation of the phase images. In this paper, the cantilever’s dynamic behaviour in tapping mode AFM is studied through a three dimensional finite element method. The cantilever’s dynamic displacement responses are firstly obtained via simulation under different tip-sample separations and for different tip-sample interaction forces, such as elastic force, adhesion force, viscosity force and the van der Waals force, which correspond to the cantilever’s action upon various different representative computer-generated test samples. Simulated results show that the dynamic cantilever displacement response can be divided into three zones: a free vibration zone, a transition zone and a contact vibration zone. Phase trajectory, phase shift, transition time, pseudo stable amplitude and frequency changes are then analysed from the dynamic displacement responses that are obtained. Finally, experiments are carried out on a real AFM system to support the findings of the simulations.
|Additional Information:||This is the peer reviewed version of the following article: Deng, W., Zhang, G., Murphy, M. F., Lilley, F., Harvey, D. M., Burton, D. R. (2015) Analysis of Dynamic Cantilever Behaviour in Tapping Mode Atomic Force Microscopy, which has been published in final form at http://dx.doi.org/10.1002/jemt.22558 This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Self-Archiving.|
|Uncontrolled Keywords:||0299 Other Physical Sciences, 0601 Biochemistry And Cell Biology, 0912 Materials Engineering|
|Subjects:||Q Science > QC Physics
Q Science > QD Chemistry
T Technology > T Technology (General)
|Divisions:||General Engineering Research Institute|
|Date Deposited:||29 Jul 2015 10:29|
|Last Modified:||10 Sep 2015 13:39|
Available Versions of this Item
- Analysis of Dynamic Cantilever Behaviour in Tapping Mode Atomic Force Microscopy. (deposited 29 Jul 2015 10:29) [Currently Displayed]
Actions (login required)