Manut, AB and Zhang, JF and Duan, M and Ji, Z and Zhang, WD and kaczer, B and Schram, T and Horiguchi,, N and Groeseneken, G (2015) Impact of Hot Carrier Aging on Random Telegraph Noise and Within a Device Fluctuation. IEEE Journal of the Electron Devices Society. ISSN 2168-6734
This is the latest version of this item.
J-EDS-2015-Revised-final.pdf - Accepted Version
For nanometer MOSFETs, charging and discharging a single trap induces random telegraph noise (RTN). When there are more than a few traps, RTN signal becomes complex and appears as within a device fluctuation (WDF). RTN/WDF causes jitters in switch timing and is a major challenge to low power circuits. In addition to RTN/WDF, devices also age. The interaction between RTN/WDF and aging is of importance and not fully understood. Some researchers reported aging increasing RTN/WDF, while others showed RTN/WDF being hardly affected by aging. The objective of this work is to investigate the impact of hot carrier aging (HCA) on the RTN/WDF of nMOSFETs. For devices of average RTN/WDF, it is found that the effect of HCA is generally modest. For devices of abnormally high RTN/WDF, however, for the first time, we report HCA reducing RTN/WDF substantially (>50%). This reduction originates from either a change of current distribution or defect losses.
|Additional Information:||(c) 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works.|
|Subjects:||T Technology > TK Electrical engineering. Electronics. Nuclear engineering|
|Divisions:||Electronics and Electrical Engineering|
|Date Deposited:||07 Jan 2016 14:27|
|Last Modified:||07 Jan 2016 14:27|
Available Versions of this Item
Impact of Hot Carrier Aging on Random Telegraph Noise and Within a Device Fluctuation. (deposited 17 Nov 2015 07:46)
- Impact of Hot Carrier Aging on Random Telegraph Noise and Within a Device Fluctuation. (deposited 07 Jan 2016 14:27) [Currently Displayed]
Actions (login required)