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Predictive As-Grown-Generation Model for Nbti of Advanced Cmos Devices and Circuits

Ji, Z, Gao, R and Zhang, JF (2018) Predictive As-Grown-Generation Model for Nbti of Advanced Cmos Devices and Circuits. In: Proceedngs of IEEE China Semiconductor Technology International Conference 2018 (CSTIC 2018) . (2018 China Semiconductor Technology International Conference (CSTIC), 11-12th March 2018, Shanghai, China).

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Abstract

Increasing pressure on the quest towards low power applications with stringent reliability demands requires narrowing the gap between NBTI models and real circuit operation for design optimization. In this work, we reviewed the recent-proposed As-grown-Generation (AG) model. By separating different types of defects through experiment, we demonstrated that it can make reliable prediction beyond the measurement window. Compared with other existing models, the proposed model delivered its original mission: Reliably predicting long term aging at low Vg based on a model extracted from Vg-accelerated short tests. Its simple formula makes it readily implementable for circuit level simulation.

Item Type: Conference or Workshop Item (Paper)
Subjects: T Technology > TK Electrical engineering. Electronics. Nuclear engineering
Divisions: Electronics and Electrical Engineering
Publisher: IEEE
Date Deposited: 26 Mar 2018 09:09
Last Modified: 26 Mar 2018 09:09
URI: http://researchonline.ljmu.ac.uk/id/eprint/8363

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