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Zhang, JF, Manut, AB, Gao, R, Mehedi, M, Ji, Z, Zhang, WD and Marsland, J (2019) An assessment of RTN-induced threshold voltage jitter. In: 2019 IEEE 13th International Conference on ASIC (ASICON) . (2019 13th IEEE International Conference on ASIC, 29 Oct - 1 Nov 2019, Chongqing, China).
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Abstract
Power consumption is a key issue especially for the edge devices/units in an IoT system. Lowering operation voltage is an effective way to reduce power. As the overdrive voltage, Vg-Vth, becomes smaller, the device is more vulnerable to threshold voltage jitters. One source for the jitter is Random Telegraph Noises (RTN), which cause a fluctuation in both drain current, ΔId, and threshold voltage, ΔVth. Early works on RTN were focused on measuring ΔId and then evaluate ΔVth from ΔId/gm, where gm is transconductance. The accuracy of ΔVth obtained in this way is not known. The objective of this work is to assess its accuracy by comparing it with the ΔVth directly measured from pulse Id-Vg. It will be shown that the correlation between these two is poor, so that ΔVth must not be evaluated from ΔId/gm. This is caused by the device-specific localized current distribution near the threshold.
| Item Type: | Conference or Workshop Item (Paper) |
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| Additional Information: | © 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. |
| Subjects: | T Technology > TK Electrical engineering. Electronics. Nuclear engineering |
| Divisions: | Electronics & Electrical Engineering (merged with Engineering 10 Aug 20) |
| Publisher: | IEEE |
| Date Deposited: | 11 Nov 2019 09:59 |
| Last Modified: | 09 Jul 2024 09:38 |
| DOI or ID number: | 10.1109/ASICON47005.2019.8983559 |
| URI: | https://researchonline.ljmu.ac.uk/id/eprint/11730 |
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