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True Random Number Generator Based on Switching Probability of Volatile Gexse1-X Ovonic Threshold Switching Selectors

Chai, Z, Freitas, P, Zhang, WD, Zhang, JF and Marsland, J True Random Number Generator Based on Switching Probability of Volatile Gexse1-X Ovonic Threshold Switching Selectors. In: 2021 IEEE 14th International Conference on ASIC, 26 October 2021 - 29 October 2021, Kunming, China. (Accepted)

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Abstract

GexSe1-x Ovonic Threshold Switching (OTS) selector is a promising candidate to suppress the sneak current paths in resistive switching memory arrays. A novel method is developed to quantitatively characterize the variations in the threshold voltage (Vth), the hold voltage (Vhd), and the switching probability dependence on the OTS operation conditions. The time-to-switch-on/off (ton/toff) at a constant VOTS follows the Weibull distribution, based on which the dependence of switching probability on pulse waveform, bias, and time can be extracted and extrapolated. Based on this analysis, a novel technique for true random number generator (TRNG) application is proposed. The inherent variability in OTS threshold voltage results in a bimodal distribution of on/off states which can be easily converted into digital bits. The experimental evaluation shows that the proposed TRNG enables the generation of high-quality random bits that passed 12 tests in the NIST statistical test suite without complex external circuits for post-processing.

Item Type: Conference or Workshop Item (Paper)
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
T Technology > TK Electrical engineering. Electronics. Nuclear engineering
Divisions: Engineering
Date Deposited: 30 Sep 2021 09:26
Last Modified: 30 Sep 2021 09:26
URI: https://researchonline.ljmu.ac.uk/id/eprint/15574

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