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Zhou, X, Hu, Z, Chai, Z, Zhang, WD, Clima, S, Degraeve, R, Zhang, JF, Fantini, A, Garbin, D, Delhougne, R, Goux, L and Kar, GS (2022) Impact of relaxation on the performance of GeSe true random number generator based on Ovonic threshold switching. IEEE Electron Device Letters, 43 (7). pp. 1061-1064. ISSN 0741-3106
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EDL-2022-Chai-04-0579.pdf - Accepted Version Download (1MB) | Preview |
Abstract
Volatile Ovonic threshold switching (OTS) are promising not only as the selector in crossbar resistive switching memory arrays, but also as true random number generators (TRNG) by utilizing its probabilistic switching characteristics. However, investigation on the reliability of OTS-based TRNG is still lacking, which hinders its practical application. Previously, we found that switching probability is dependent on the pulse amplitude and width. In this work, we report that relaxation which happens during the time interval between pulses can cause switching probability drift. Optimizing the bit-generation waveform and modulating the pulse conditions could provide a practical solution, in addition to the impact of external bias and temperature. This work provides useful guidance for the
practical design and operation of OTS-based TRNGs.
| Item Type: | Article |
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| Additional Information: | © 2022 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. |
| Uncontrolled Keywords: | Applied Physics; 0906 Electrical and Electronic Engineering |
| Subjects: | Q Science > QC Physics T Technology > T Technology (General) T Technology > TA Engineering (General). Civil engineering (General) T Technology > TK Electrical engineering. Electronics. Nuclear engineering |
| Divisions: | Engineering |
| Publisher: | Institute of Electrical and Electronics Engineers |
| SWORD Depositor: | A Symplectic |
| Date Deposited: | 30 May 2022 14:22 |
| Last Modified: | 02 Nov 2023 12:15 |
| DOI or ID number: | 10.1109/LED.2022.3179590 |
| URI: | https://researchonline.ljmu.ac.uk/id/eprint/16975 |
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