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Equiprobability-based Local Response Surface Method for High-Sigma Yield Estimation with Both High Accuracy and Efficiency

Liu, X, Ren, P, Chen, H, Ji, Z, Liu, J, Wang, R, Zhang, JF and Huang, R Equiprobability-based Local Response Surface Method for High-Sigma Yield Estimation with Both High Accuracy and Efficiency. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. p. 1. ISSN 0278-0070 (Accepted)

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Abstract

With the ever-increasing transistor density and memory capability in integrated circuits, the high-sigma yield estimation has become a growing concern. This work presents an equiprobability-based local response surface method (ELRS) that can perform high-sigma yield estimation with both high accuracy and efficiency. Demonstrating with 6T-SRAM, the proposed method exhibits more than 10 times improvement in accuracy when comparing with the state-of-the-art while maintaining the efficiency to the best record in literature.

Item Type: Article
Additional Information: © 2022 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Uncontrolled Keywords: 0906 Electrical and Electronic Engineering; 1006 Computer Hardware; Computer Hardware & Architecture
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
Divisions: Engineering
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
SWORD Depositor: A Symplectic
Date Deposited: 29 Jul 2022 11:43
Last Modified: 29 Jul 2022 11:45
DOI or Identification number: 10.1109/tcad.2022.3193875
URI: https://researchonline.ljmu.ac.uk/id/eprint/17292

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