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Gao, R, Manut, AB, Ji, Z, Ma, J, Duan, M, Zhang, JF, Franco, J, Hatta, SFWM, Zhang, WD, Kaczer, B, Vigar, D, Linten, D and Groeseneken, G
(2017)
Reliable time exponents for long term prediction of negative bias temperature instability by extrapolation.
IEEE Transactions on Industrial Electronics, 64 (4).
pp. 1467-1473.
ISSN 0278-0046