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Chang, M H (2006) Electron trapping in gate dielectrics and NBTI of MOSFETs. Doctoral thesis, Liverpool John Moores University.
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| Item Type: | Thesis (Doctoral) |
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| Subjects: | T Technology > TK Electrical engineering. Electronics. Nuclear engineering |
| Divisions: | Electronics & Electrical Engineering (merged with Engineering 10 Aug 20) |
| Date Deposited: | 08 Mar 2017 10:07 |
| Last Modified: | 03 Sep 2021 23:30 |
| DOI or ID number: | 10.24377/LJMU.t.00005798 |
| URI: | https://researchonline.ljmu.ac.uk/id/eprint/5798 |
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