Facial reconstruction

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Items where Author is "Cai, Y"

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Article

Du, Y, Jing, L, Fang, H, Chen, H, Cai, Y, Wang, R, Zhang, JF and Ji, Z Exploring the impact of random telegraph noise-induced accuracy loss in Resistive RAM-based deep neural network. IEEE Transactions on Electron Devices, 67. ISSN 0018-9383 (Accepted)

Conference or Workshop Item

Kang, J, Yu, Z, Wu, L, Fang, Y, Wang, Z, Cai, Y, Ji, Z, Zhang, JF, Wang, R, Yang, Y and Huang, R (2017) Time-Dependent Variability in RRAM-based Analog Neuromorphic System for Pattern Recognition. In: Technical Digest of the IEEE International Electron Devices Meeting (IEDM), . (2017 International Electron Devices Meeting (IEDM),, 2nd-6th December 2017, San Fransisco, USA).

This list was generated on Tue Dec 7 18:06:19 2021 UTC.