Facial reconstruction

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Article

Du, Y, Jing, L, Fang, H, Chen, H, Cai, Y, Wang, R, Zhang, JF and Ji, Z (2020) Exploring the impact of random telegraph noise-induced accuracy loss in Resistive RAM-based deep neural network. IEEE Transactions on Electron Devices, 67 (8). pp. 3335-3340. ISSN 0018-9383

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