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Tok, KH, Zhang, JF, Brown, J, Ye, Z, Ji, Z, Zhang, WD and Marsland, JS (2022) AC RTN: Testing, Modeling, and Prediction. IEEE Transactions on Electron Devices. pp. 1-7. ISSN 0018-9383

Tok, KH, Mehedi, M, Zhang, JF, Brown, J, Ye, Z, Ji, Z, Zhang, W, Marsland, JS, Asenov, A and Georgiev, V (2022) An Integral Methodology for Predicting Long Term RTN. IEEE Transactions on Electron Devices. ISSN 0018-9383

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