Items where Author is "Tok, D"
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Conference or Workshop Item
Zhang, JF, Duan, M, Mehedi, M, Tok, D, Ye, Z, Ji, Z and Zhang, WD Defect loss and its physical processes. In: IEEE 15th International Conference on Solid-State and Integrated-Circuit Technology, 03 November 2020 - 06 November 2020, Kunming. (Accepted)