Items where Author is "Zhan, X"
Up a level |
Zhan, X (2024) A Design-led Research Project in Urban Regeneration: How Human Centred Emotional Design Can Help in Restructuring the Post-industrial Site. Doctoral thesis, Liverpool John Moores University.
Guo, FB, Roberts, EE, Zhan, X and Johnston, K (2023) Driving renovation: A comparative research project in urban regeneration across cities in China. Journal of Urban Regeneration and Renewal, 17 (2). pp. 172-189. ISSN 1752-9638
Zhan, X, Guo, FB and Roberts, E (2023) Image-Based Research Methods for Mapping Tourist Behaviour: Smart Photos. Tourism Recreation Research. ISSN 0250-8281
Zhan, X, Guo, FB, Fairclough, SH and Lee, D (2021) Psychological Impact on Design: Empirical Case Studies in City Regeneration of Post-Industrial Sites. In: Advances in Neuroergonomics and Cognitive Engineering . pp. 320-327. (AHFE 2021:3rd international conference on Industrial Cognitive Ergonomics and Engineering Psychology (ICEEP), 25 July 2021 - 29 July 2021, New York, USA).
Du, Y, Zheng, Y, Yu, CX, Zhong, L, Li, Y, Wu, B, Hu, W, Zhu, EW, Xie, VW, Xu, Q, Zhan, X, Huang, Y, Zeng, L, Zhang, Z, Liu, X, Yin, J, Zha, G, Chan, K and Tsim, KWK (2021) The Mechanisms of Yu Ping Feng San in Tracking the Cisplatin-Resistance by Regulating ATP-Binding Cassette Transporter and Glutathione S-Transferase in Lung Cancer Cells. Frontiers in Pharmacology, 12. ISSN 1663-9812
Guo, FB, Roberts, EE, Zhan, X and Johnston, K (2021) Consideration of Human-Centered Emotional Design and Cultural Strategy in Urban Regeneration in China. Journal of Urban Design. ISSN 1357-4809
Ge, X, Qu, J and Zhan, X (2020) A Review of the Indicators for Assessing the Sustainability of Urban Regeneration. In: 2020 Annual Conference on Big Data, IoT, Engineering Management (BDIEM) . (2020 Annual Conference on Big Data, IoT, Engineering Management (BDIEM), 27 July 2020 - 29 July 2020, Shenyang, China).
Zhan, X, Shen, C, Ji, Z, Chen, J, Fang, H, Guo, F and Zhang, JF (2019) A Dual-Point technique for the entire ID-VG characterization into subthreshold region under Random Telegraph Noise condition. IEEE Electron Device Letters, 40 (5). pp. 674-677. ISSN 0741-3106