Facial reconstruction

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Items where Division is "Electronics and Electrical Engineering (merged with Engineering 10 Aug 20)" and Year is 2006

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Number of items: 2.

C

Chang, M H (2006) Electron trapping in gate dielectrics and NBTI of MOSFETs. Doctoral thesis, Liverpool John Moores University.

Z

Zahid, M B (2006) Characterization of high-k layers as the gate dielectric for MOSFETs. Doctoral thesis, Liverpool John Moores University.

This list was generated on Tue Dec 10 12:44:57 2024 UTC.