Facial reconstruction

Search LJMU Research Online

Browse Repository | Browse E-Theses

Items where Author is "Hellings, G"

Up a level
Export as [feed] Atom [feed] RSS
Group by: Item Type | No Grouping
Number of items: 1.

Ji, Z, Linten, D, Boschke, R, Hellings, G, Chen, SH, Alian, A, Zhou, D, Mols, Y, Ivanov, T, Franco, J, Kaczer, B, Zhang, X, Gao, R, Zhang, JF, Zhang, WD and Collaert, N (2015) ESD characterization of planar InGaAs devices. In: Reliability Physics Symposium (IRPS), 2015 IEEE International . 3F.1.1-3F.1.7. (IEEE International Reliability Physics Symposium (IRPS), 19th April - 23th April 2015, Monterey, CA).

This list was generated on Fri Mar 29 09:45:04 2024 UTC.