Deng, W and Zhang, G and Murphy, MF and Lilley, F and Harvey, DM and Burton, DR (2015) Analysis of dynamic cantilever behavior in tapping mode atomic force microscopy. Microscopy Research and Technique, 78 (10). pp. 935-946. ISSN 1097-0029
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Tapping mode atomic force microscopy (AFM) provides phase images in addition to height and amplitude images. Although the behavior of tapping mode AFM has been investigated using mathematical modeling, comprehensive understanding of the behavior of tapping mode AFM still poses a significant challenge to the AFM community, involving issues such as the correct interpretation of the phase images. In this paper, the cantilever's dynamic behavior in tapping mode AFM is studied through a three dimensional finite element method. The cantilever's dynamic displacement responses are firstly obtained via simulation under different tip-sample separations, and for different tip-sample interaction forces, such as elastic force, adhesion force, viscosity force, and the van der Waals force, which correspond to the cantilever's action upon various different representative computer-generated test samples. Simulated results show that the dynamic cantilever displacement response can be divided into three zones: a free vibration zone, a transition zone, and a contact vibration zone. Phase trajectory, phase shift, transition time, pseudo stable amplitude, and frequency changes are then analyzed from the dynamic displacement responses that are obtained. Finally, experiments are carried out on a real AFM system to support the findings of the simulations. Microsc. Res. Tech., 2015. © 2015 Wiley Periodicals, Inc.
|Additional Information:||This is the peer reviewed version of the following article: Deng, W., Zhang, G., Murphy, M. F., Lilley, F., Harvey, D. M., Burton, D. R. (2015) Analysis of Dynamic Cantilever Behaviour in Tapping Mode Atomic Force Microscopy, which has been published in final form at http://dx.doi.org/10.1002/jemt.22558 This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Self-Archiving.|
|Uncontrolled Keywords:||0299 Other Physical Sciences, 0601 Biochemistry And Cell Biology, 0912 Materials Engineering|
|Subjects:||Q Science > QC Physics
Q Science > QD Chemistry
T Technology > T Technology (General)
|Divisions:||General Engineering Research Institute|
|Date Deposited:||19 Nov 2015 07:55|
|Last Modified:||19 Nov 2015 07:55|
|DOI or Identification number:||10.1002/jemt.22558|
Available Versions of this Item
Analysis of Dynamic Cantilever Behaviour in Tapping Mode Atomic Force Microscopy. (deposited 29 Jul 2015 10:29)
Analysis of dynamic cantilever behavior in tapping mode atomic force microscopy. (deposited 05 Nov 2015 13:11)
- Analysis of dynamic cantilever behavior in tapping mode atomic force microscopy. (deposited 19 Nov 2015 07:55) [Currently Displayed]
- Analysis of dynamic cantilever behavior in tapping mode atomic force microscopy. (deposited 05 Nov 2015 13:11)
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