Items where Author is "Lin, D"

Lin, D ORCID: 0009-0000-2253-5100, Zheng, X ORCID: 0000-0002-9410-3849, Yue, S ORCID: 0000-0002-0904-4857, Yi, L ORCID: 0009-0003-4577-7374, Wang, X ORCID: 0000-0002-0943-1427, Zhang, H, Liu, K ORCID: 0000-0002-5269-7175, Jia, M ORCID: 0000-0002-3066-9755, Wang, Y ORCID: 0000-0003-0606-5588, Lv, L ORCID: 0000-0001-5028-4492, Cao, Y ORCID: 0009-0001-8987-0154, Zhang, W ORCID: 0000-0003-4600-7382, Hu, P, Liu, J ORCID: 0000-0002-1639-7239, Ma, X ORCID: 0000-0002-1331-6253 and Hao, Y ORCID: 0000-0002-8081-2919 (2026) Investigation on the Cumulative Degradation in p-GaN Gate HEMTs Under Synergistic Electrical Stress and Heavy Ion Irradiation. IEEE Transactions on Electron Devices, 73 (99). ISSN 0018-9383

Zhang, H, Zheng, X, Lin, D, Hong, Y, Zhou, J, Lv, L, Cao, Y, Han, H, Zhang, W ORCID: 0000-0003-4600-7382, Zhang, J, Ma, X and Hao, Y (2024) Study on the Degradation Mechanism of GaN MMIC Power Amplifiers under on-state with High Drain Bias. IEEE Transactions on Electron Devices. pp. 1-5. ISSN 0018-9383

Zhang, H ORCID: 0000-0003-1689-8532, Zheng, X ORCID: 0000-0002-9410-3849, Lin, D, Lv, L, Cao, Y, Hong, Y ORCID: 0000-0002-2067-2168, Zhang, F ORCID: 0000-0002-1092-4368, Wang, X ORCID: 0000-0002-0943-1427, Wang, Y ORCID: 0000-0003-0606-5588, Zhang, W ORCID: 0000-0003-4600-7382, Zhang, J ORCID: 0000-0003-4987-6428, Ma, X and Hao, Y ORCID: 0000-0001-7876-8878 (2024) Study on the single-event burnout mechanism of GaN MMIC power amplifiers. Applied Physics Letters, 124 (8). ISSN 0003-6951