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Zhang, H, Zheng, X, Lin, D, Hong, Y, Zhou, J, Lv, L, Cao, Y, Han, H, Zhang, W, Zhang, J, Ma, X and Hao, Y (2024) Study on the Degradation Mechanism of GaN MMIC Power Amplifiers under on-state with High Drain Bias. IEEE Transactions on Electron Devices. pp. 1-5. ISSN 0018-9383

Zhang, H, Zheng, X, Lin, D, Lv, L, Cao, Y, Hong, Y, Zhang, F, Wang, X, Wang, Y, Zhang, W, Zhang, J, Ma, X and Hao, Y (2024) Study on the single-event burnout mechanism of GaN MMIC power amplifiers. Applied Physics Letters, 124 (8). ISSN 0003-6951