Items where Author is "Salleh, MAAM"
 | Up a level |
Group by: Item Type | No Grouping
Number of items: 1.
Wang, H, Zhang, G, Ma, H, Zhang, X, Manzanera, TP, Braden, D, Harvey, D and Salleh, MAAM (2023) Reliability and Failure Modelling of Microelectronic Packages Based on Ultrasonic Nondestructive Evaluation Data. Independent Nondestructive Testing and Evaluation (NDT and E) International. ISSN 0963-8695