Items where Author is "Salleh, MAAM"
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Article
Wang, H, Zhang, G ORCID: 0000-0002-2351-2661, Ma, H, Zhang, X, Manzanera, TP, Braden, D, Harvey, D and Salleh, MAAM
(2023)
Reliability and Failure Modelling of Microelectronic Packages Based on Ultrasonic Nondestructive Evaluation Data.
Independent Nondestructive Testing and Evaluation (NDT and E) International.
ISSN 0963-8695