Items where Author is "Xue, Y"

Article

Ji, Z, Xue, Y, Ren, P, Ye, J, Li, Y, Wu, Y, Wang, D, Wang, S, Wu, J, Wang, Z, Wen, Y, Xia, S, Zhang, L, Zhang, J ORCID: 0000-0003-4987-6428, Liu, J, Luo, J, Deng, H, Wang, R, Yang, L and Huang, R (2023) Towards Reliability- & Variability-aware Design-Technology Co-optimization in Advanced Nodes: Defect Characterization, Industry-friendly Modelling and ML-assisted Prediction. IEEE Transactions on Electron Devices, 71 (1). pp. 138-150. ISSN 0018-9383

Xue, Y, Ren, P, Wu, J, Liu, Z, Wang, S, Li, Y, Wang, Z, Sun, Z, Wang, D, Wen, Y, Xia, S, Zhang, L, Zhang, J ORCID: 0000-0003-4987-6428, Ji, Z, Luo, J, Deng, H, Wang, R, Yang, L and Huang, R (2023) On the understanding of PMOS NBTI degradation in advance nodes: Characterization, modeling and exploration on the physical origin of defects. IEEE Transactions on Electron Devices, 70 (9). pp. 4518-4524. ISSN 0018-9383

Tu, Z, Xue, Y, Ren, P, Hao, F, Wang, R, Li, M, Zhang, JF, Ji, Z and Huang, R (2021) A Probability-based Strong Physical Unclonable Function with Strong Machine Learning Immunity. IEEE Electron Device Letters. ISSN 0741-3106

Haber, M, Doumet-Serhal, C, Scheib, CL, Xue, Y, Mikulski, R, Martiniano, R, Fischer-Genz, B, Schutkowski, H, Kivisild, T and Tyler-Smith, C (2019) A Transient Pulse of Genetic Admixture from the Crusaders in the Near East Identified from Ancient Genome Sequences. American Journal of Human Genetics, 104 (5). pp. 977-984. ISSN 0002-9297

Nagle, N, Van Oven, M, Wilcox, S, Van Holst Pellekaan, S, Tyler-Smith, C, Xue, Y, Ballantyne, KN, Wilcox, L, Papac, L, Cooke, K, Van Oorschot, RAH, McAllister, P, Williams, L, Kayser, M, Mitchell, RJ, Adhikarla, S, Adler, CJ, Balanovska, E, Balanovsky, O, Bertranpetit, J et al (2017) Aboriginal Australian mitochondrial genome variation - An increased understanding of population antiquity and diversity. Scientific Reports, 7. ISSN 2045-2322

Conference or Workshop Item

Wu, J, Ren, P, Zhang, C, Xiao, Y, Xue, Y, Li, Y, Wang, X, Zhang, L, Liu, J, Zhang, J ORCID: 0000-0003-4987-6428, Wang, R, Ji, Z and Huang, R (2024) Comprehensive Understanding of Flicker Noise in Advanced FinFET Technology: from Noise Sources Separation to Physical-based Modeling. In: 2023 International Electron Devices Meeting (IEDM) . pp. 1-4. (69th Annual IEEE International Electron Devices Meeting (IEDM), 9th - 13th December 2023, San Francisco, USA).