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Xue, Y, Ren, P, Wu, J, Liu, Z, Wang, S, Li, Y, Wang, Z, Sun, Z, Wang, D, Wen, Y, Xia, S, Zhang, L, Zhang, J, Ji, Z, Luo, J, Deng, H, Wang, R, Yang, L and Huang, R (2023) On the understanding of PMOS NBTI degradation in advance nodes: Characterization, modeling and exploration on the physical origin of defects. IEEE Transactions on Electron Devices, 70 (9). pp. 4518-4524. ISSN 0018-9383

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Conference or Workshop Item

Wu, J, Ren, P, Zhang, C, Xiao, Y, Xue, Y, Li, Y, Wang, X, Zhang, L, Liu, J, Zhang, J, Wang, R, Ji, Z and Huang, R (2024) Comprehensive Understanding of Flicker Noise in Advanced FinFET Technology: from Noise Sources Separation to Physical-based Modeling. In: 2023 International Electron Devices Meeting (IEDM) . pp. 1-4. (69th Annual IEEE International Electron Devices Meeting (IEDM), 9th - 13th December 2023, San Francisco, USA).