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Items where Division is "Electronics & Electrical Engineering (merged with Engineering 10 Aug 20)" and Year is

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Number of items: 29.

A

Abduallah, AA, Dordevic, O and Jones, M Multidirectional Power Flow Control among Double Winding Six-Phase Induction Machine Winding Sets. In: IEEE Industrial Electronics Society Annual Conference IECON, 29 October 2017 - 01 November 2017, Beijing, China. (Accepted)

Al-Attabi, AW, Harris, C, Alkhaddar, R, Alzeyadi, A and Hashim, KS Treatment of Residential Complexes’ Wastewater using Environmentally Friendly Technology. In: Procedia Engineering . (Creative Construction Conference 2017, CCC 2017, 18 June 2017 - 22 June 2017, Primosten, Croatia). (Accepted)

Al-Attabi, AWN, Harris, C, Alkhaddar, R, Alzeyadi, A and Abdulredha, M Online Monitoring of a Sequencing Batch Reactor Treating Domestic Wastewater. In: Procedia Engineering . (Creative Construction Conference 2017, CCC 2017, 18 June 2017 - 22 June 2017, Primosten, Croatia). (Accepted)

B

Brown, J, Gao, R, Ji, Z, Chen, J, Wu, J, Zhang, JF, Zhou, B, Shi, Q, Crawford, J and Zhang, WD A low-power and high-speed True Random Number Generator using generated RTN. In: 2018 Symposia on VLSI Technology and Circuits, 18 June 2018 - 22 June 2018, Hawaii US. (Accepted)

C

Chai, Z, Zhang, W, Degraeve, R, Clima, S, Hatem, F, Zhang, JF, Freitas, P, Marsland, J, Fantini, A, Garbin, D, Goux, L and Kar, G Evidence of filamentary switching and relaxation mechanisms in GexSe1-x OTS selectors. In: 2019 Symposia on VLSI Technology and Circuits, 10 June 2019 - 14 June 2019, Kyoto, Japan. (Accepted)

D

Du, Y, Jing, L, Fang, H, Chen, H, Cai, Y, Wang, R, Zhang, JF and Ji, Z Exploring the impact of random telegraph noise-induced accuracy loss in Resistive RAM-based deep neural network. IEEE Transactions on Electron Devices, 67. ISSN 0018-9383 (Accepted)

Duan, M, Zhang, JF, Ji, Z and Zhang, WD TOWARDS UNDERSTANDING INTERACTION BETWEEN HOT CARRIER AGEING AND PBTI. In: Proc. IEEE China Semiconductor Technology International Conference (CSTIC) . (China Semiconductor Technology International Conference (CSTIC)., 26-27th June 2020, Shanghai, China). (Accepted)

Duffy, S, Benbakhti, B, Zhang, WD, Ahmeda, K, Kalna, K, Boucherta, M, Mattalah, M, Chahdi, HO, Bourzgui, N-E and Soltani, A A Parametric Technique for Traps Characterization in AlGaN/GaN HEMTs. IEEE Transactions on Electron Devices. ISSN 0018-9383 (Accepted)

Duffy, SJ, Benbakhti, B, Zhang, WD, Kalna, K, Ahmeda, K, Boucherta, M, Bourzgui, N, Maher, H and Soltani, A A Source and Drain Transient Currents Technique for Trap Characterisation in AlGaN/GaN HEMTs. In: European Microwave Week 2018, 23 - 28 September 2018, Madrid, Spain. (Accepted)

G

Guo, FB Capturing Imagination: A Shift from Teaching to Learning. In: ICERI2017 . (10th International Coference of Education and Research and Innovation, 16 November 2017 - 18 November 2017, Seville, Spain). (Accepted)

Guo, FB, Roberts, EE, Du, H, Wang, Y, Chen, Y and Ge, X A Comparative Research of Culture-led Regeneration across Cities in China. In: ICUSP 2019 : International Conference on Urban Studies and Planning, 20 August 2019 - 21 August 2019, London. (Accepted)

Guo, Y, Li, H, Zhang, WD and Robertson, J Structural changes during the switching transition of Chalcogenide Selector devices. Applied Physics Letters. ISSN 0003-6951 (Accepted)

H

Hatem, F, Chai, Z, Zhang, WD, Fantini, A, Degraeve, R, Clima, S, Garbin, D, Robertson, J, Guo, Y, Zhang, JF, Marsland, J, Freitas, P, Goux, L and Kar, G Endurance improvement of more than five orders in GexSe1-x OTS selectors by using a novel refreshing program scheme. In: IEEE International Electron Device Meeting (IEDM), 09 December 2019 - 11 December 2019, San Francisco. (Accepted)

J

Johnson, P and Jablokow, K How do engineering students perceive the importance of creativity within their own leadership development? In: American Society for Engineering Education. ASEE Annual Conference Proceedings . (2019 ASEE Annual Conference & Exposition, 16 June 2019 - 19 June 2019, Tampa, Florida). (Accepted)

Joksas, D, Freitas, P, Chai, Z, Ng, WH, Buckwell, M, Li, C, Zhang, WD, Xia, QF, Kenyon, AJ and Mehonic, A Committee Machines—A Universal Method to Deal with Non-Idealities in Memristor-Based Neural Networks. Nature Communications. ISSN 2041-1723 (Accepted)

M

Manut, AB, Zhang, JF, Ji, Z and Zhang, WD INTERACTION BETWEEN RANDOM TELEGRAPH NOISE AND HOT CARRIER AGEING. In: IEEE Explore . (IEEE China Semiconductor Technology International Conference (CSTIC), 18-19 March 2019, Shanghai, China). (Accepted)

N

Nguyen, QH, Johnson, P, Nguyen, TT and Randles, M A novel architecture using iBeacons for localization and tracking of people within healthcare environment. In: Global IoT Summit, 17 June 2019 - 21 June 2019, Aarhus, Denmark. (Accepted)

P

Picot, H, Ateeq, M, Abdullah, B and Cullen, J Industry 4.0 – LabVIEW Based Industrial IoT Condition Monitoring System. In: IEEE Explore . (Developments in eSystems Engineering 2019 Robotics, Sensors and Industry 4.0, 07 October 2019 - 10 October 2019, Kazan, Russia). (Accepted)

S

Slunjski, M, Stiscia, O, Jones, M and Levi, E General Torque Enhancement Approach for a Nine-Phase Surface PMSM with Built-in Fault Tolerance. IEEE Transactions on Industrial Electronics. ISSN 0278-0046 (Accepted)

Sufian, A, Abdullah, B, Ateeq, M, Wah, R and Clements, D A roadmap towards the smart factory. In: IEEE Explore . (Developments in eSystems Engineering 2019 Robotics, Sensors and Industry 4.0, 07 October 2019 - 10 October 2019, Kazan, Russia). (Accepted)

V

Vujacic, M, Hammami, M, Dordevic, O and Gabriele, G Evaluation of DC-Link voltage ripple in five-phase PWM voltage source inverters. In: The 9th International Conference on Power Electronics, Machines and Drives, PEMD, 17 April 2018 - 19 April 2018, Liverpool, England, UK. (Accepted)

Z

Zhang, JF, Duan, M, Ji, Z and Zhang, W Hot carrier aging of nano-meter devices. In: 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) . (2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT), 25th - 28th October 2016, Hangzhou, China). (Accepted)

Zhang, JF, Duan, M, Ji, Z and Zhang, WD Hot carrier aging of nano-scale devices: characterization method, statistical variation, and their impact on use voltage. In: IEEE 12th International Conference on ASIC, 24 October 2017 - 28 October 2017, Guiyang, China.. (Accepted)

Zhang, JF, Duan, M, Ji, Z and Zhang, WD A framework for defects in PBTI and hot carrier ageing. In: Proceeging of IEEE 14th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT), 2018 . (14th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT), 31st October - 3rd November 2018, Qingdao, China). (Accepted)

Zhang, JF, Gao, R, Ji, Z and Zhang, WD Challenge and solution for characterizing NBTI-generated defects in nanoscale devices. In: Proceedings of The 26th International Symposium on the Physical nand Failure Analysis of Integrated Circuits . (International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2 - 5 July 2019, Hangzhou, China). (Accepted)

Zhang, JF, Ji, Z and Zhang, WD The As-grown-Generation (AG) model: A reliable model for reliability prediction under real use conditions. In: IEEE 24th International Symposium on The Physical and Failure Analysis of Integrated Circuits, 04 July 2017 - 07 July 2017, Chengdu. (Accepted)

Zhang, JF, Ma, J, Zhang, WD and Ji, Z DEFECTS AND LIFETIME PREDICTION FOR GE PMOSFETS UNDER AC NBTI STRESSES. In: China Semiconductor Technology International Conference (CSTIC), 11 March 2017 - 13 March 2017, Shanghai, China. (Accepted)

Zhang, JF, Manut, AB, Gao, R, Mehedi, M, Ji, Z, Zhang, WD and Marsland, J An assessment of RTN-induced threshold voltage jitter. In: Proceedings of 2019 13th IEEE International Conference on ASIC (ASICON), ChongQing, 2019. . (2019 13th IEEE International Conference on ASIC, 29 Oct - 1 Nov 2019, Chongqing, China). (Accepted)

Zhang, WD, Chai, Z, Ma, J and Zhang, JF Analysis of switching, degradation and failure mechanisms by RTN signals in non-filamentary (a-VMCO) RRAM devices. In: ICSICT 2018, 31 October 2018 - 03 November 2018, Qingdao, China. (Accepted)

This list was generated on Thu Aug 13 22:29:51 2020 UTC.