Conference or Workshop Item

Guo, FB Capturing Imagination: A Shift from Teaching to Learning. In: ICERI2017 . (10th International Coference of Education and Research and Innovation, 16 November 2017 - 18 November 2017, Seville, Spain). (Accepted)

Guo, FB, Roberts, EE, Du, H, Wang, Y, Chen, Y and Ge, X A Comparative Research of Culture-led Regeneration across Cities in China. In: ICUSP 2019 : International Conference on Urban Studies and Planning, 20 August 2019 - 21 August 2019, London. (Accepted)

Johnson, P and Jablokow, K How do engineering students perceive the importance of creativity within their own leadership development? In: American Society for Engineering Education. ASEE Annual Conference Proceedings . (2019 ASEE Annual Conference & Exposition, 16 June 2019 - 19 June 2019, Tampa, Florida). (Accepted)

Vujacic, M, Hammami, M, Dordevic, O and Gabriele, G Evaluation of DC-Link voltage ripple in five-phase PWM voltage source inverters. In: The 9th International Conference on Power Electronics, Machines and Drives, PEMD, 17 April 2018 - 19 April 2018, Liverpool, England, UK. (Accepted)

Zhang, JF, Duan, M, Ji, Z and Zhang, W Hot carrier aging of nano-meter devices. In: 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) . (2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT), 25th - 28th October 2016, Hangzhou, China). (Accepted)

Zhang, JF, Duan, M, Ji, Z and Zhang, WD Hot carrier aging of nano-scale devices: characterization method, statistical variation, and their impact on use voltage. In: IEEE 12th International Conference on ASIC, 24 October 2017 - 28 October 2017, Guiyang, China.. (Accepted)

Zhang, JF, Duan, M, Ji, Z and Zhang, WD A framework for defects in PBTI and hot carrier ageing. In: Proceeging of IEEE 14th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT), 2018 . (14th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT), 31st October - 3rd November 2018, Qingdao, China). (Accepted)

Zhang, JF, Gao, R, Ji, Z and Zhang, WD Challenge and solution for characterizing NBTI-generated defects in nanoscale devices. In: Proceedings of The 26th International Symposium on the Physical nand Failure Analysis of Integrated Circuits . (International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2 - 5 July 2019, Hangzhou, China). (Accepted)

Zhang, JF, Ji, Z and Zhang, WD The As-grown-Generation (AG) model: A reliable model for reliability prediction under real use conditions. In: IEEE 24th International Symposium on The Physical and Failure Analysis of Integrated Circuits, 04 July 2017 - 07 July 2017, Chengdu. (Accepted)

Zhang, JF, Ma, J, Zhang, WD and Ji, Z DEFECTS AND LIFETIME PREDICTION FOR GE PMOSFETS UNDER AC NBTI STRESSES. In: China Semiconductor Technology International Conference (CSTIC), 11 March 2017 - 13 March 2017, Shanghai, China. (Accepted)

Zhang, JF, Manut, AB, Gao, R, Mehedi, M, Ji, Z, Zhang, WD and Marsland, J An assessment of RTN-induced threshold voltage jitter. In: Proceedings of 2019 13th IEEE International Conference on ASIC (ASICON), ChongQing, 2019. . (2019 13th IEEE International Conference on ASIC, 29 Oct - 1 Nov 2019, Chongqing, China). (Accepted)

Zhang, WD, Chai, Z, Ma, J and Zhang, JF Analysis of switching, degradation and failure mechanisms by RTN signals in non-filamentary (a-VMCO) RRAM devices. In: ICSICT 2018, 31 October 2018 - 03 November 2018, Qingdao, China. (Accepted)