Article

Zhang, H, Zheng, X, Lin, D, Lv, L, Cao, Y, Hong, Y, Zhang, F, Wang, X, Wang, Y, Zhang, W, Zhang, J, Ma, X and Hao, Y (2024) Study on the single-event burnout mechanism of GaN MMIC power amplifiers. Applied Physics Letters, 124 (8). ISSN 0003-6951

Nie, X, Zhao, S, Hao, Y, Gu, S, Zhang, Y, Qi, B, Xing, Y and Qin, L (2023) Transcriptome analysis reveals key genes involved in the resistance to Cryphonectria parasitica during early disease development in Chinese chestnut. BMC Plant Biology, 23 (1). ISSN 1471-2229

Conference or Workshop Item

Duan, M, Zhang, JF, Zhang, JC, Zhang, WD, Ji, Z, Benbakhti, B, Zhang, XF, Hao, Y, Vigar, D, Chandra, V, Aitken, R, Kaczer, B, Groeseneken, G and Asenov, A (2017) Interaction between Hot Carrier Aging and PBTI Degradation in nMOSFETs: Characterization, Modelling and Lifetime Prediction. In: IEEE International Reliability Physics Symposium Proceedings . (2017 IEEE International Reliability Physics Symposium, 02 April 2017 - 06 April 2017, California, USA).